UK MBE Day 2026

UK MBE Day 2026 Overview UK MBE is an annual workshop dedicated to the field of Molecular Beam Epitaxy (MBE). The event explores current research, advances in material systems, and the technical capabilities enabled by MBE growth techniques. Participants will gain insights into practical aspects of epitaxial growth, system operation, and characterisation methods, as well […]

Processing of Organic Semiconductor Materials

Processing of Organic Semiconductors Brief description Dedicated laminar flow wet benches for work with solvents and water-based reagents. Oxygen- and water-sensitive materials processed in gloveboxes with inert gas inside. Thin film patterning of electrodes to create organic semiconductor devices. Jump to booking Wet processing Brief description Dedicated laminar flow wet benches for work with solvents […]

Surfaces, Interfaces and Thin-Films 2025

Registration Programme Speakers Venue WHEN Tue 16 Sept 2025 10:30 AM – 17:00 PM WHERE Ogden Centre East – Durham University South Road Durham DH1 3LE Register now ORGANISED BY CORDE Academy, Department of Physics – University of Cambridge IN PARTNERSHIP WITH The Institute of Physics Durham University The Durham Institute of Research, Development, and […]

Hitachi 5500

Hitachi 5500 Brief description The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging.  The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy […]

Hitachi SU 8600

Hitachi SU 8600 Brief description The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating. Jump to booking […]

Helios 600 i

Helios 600 i Brief description The Helios 600 tool is used for imaging and chemical analysis (EDS) and crystallographic analysis (EBSD).   It is also used for site specific sample preparation (both cross-section and TEM lamellae preparation), Slive and View, large area mapping   and nanopatterning and engineering.  Jump to booking A-SHeM Brief description The SHeM is […]

SPECS NAP-XPS

SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions. Part of Royce at Cambridge Jump to booking SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant […]

NEXSA G2

NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Part of Royce at Cambridge Jump to booking NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Jump to booking Technical […]

Escalab 250Xi

Escalab 250Xi​ Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability.   Part of Royce at Cambridge Jump to booking Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Jump to booking Technical specifications Key Capabilities XPS for […]