Processing of Organic Semiconductor Materials
Processing of Organic Semiconductors Brief description Dedicated laminar flow wet benches for work with solvents and water-based reagents. Oxygen- and water-sensitive materials processed in gloveboxes with inert gas inside. Thin film patterning of electrodes to create organic semiconductor devices. Jump to booking Wet processing Brief description Dedicated laminar flow wet benches for work with solvents […]
Surfaces, Interfaces and Thin-Films 2025
Registration Programme Speakers Venue WHEN Tue 16 Sept 2025 10:30 AM – 17:00 PM WHERE Ogden Centre East – Durham University South Road Durham DH1 3LE Register now ORGANISED BY CORDE Academy, Department of Physics – University of Cambridge IN PARTNERSHIP WITH The Institute of Physics Durham University The Durham Institute of Research, Development, and […]
XPS Summer School 2025
Registration Programme Speakers Venue Sponsors STARTS Mon 4 Aug 2025 10:00 AM ENDS Thu 7 Aug 2025 2:00 PM WHERE Ray Dolby Centre – Cavendish Laboratory J J Thomson Avenue Cambridge CB3 0US Registration has closed ORGANISED BY CORDE Academy, Department of Physics In partnership with Royce at Cambridge, Henry Royce Institute Contact the organiser […]
Hitachi 5500
Hitachi 5500 Brief description The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging. The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy […]
Hitachi SU 8600
Hitachi SU 8600 Brief description The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating. Jump to booking […]
Helios 600 i
Helios 600 i Brief description The Helios 600 tool is used for imaging and chemical analysis (EDS) and crystallographic analysis (EBSD). It is also used for site specific sample preparation (both cross-section and TEM lamellae preparation), Slive and View, large area mapping and nanopatterning and engineering. Jump to booking A-SHeM Brief description The SHeM is […]
SPECS NAP-XPS
SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions. Part of Royce at Cambridge Jump to booking SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant […]
NEXSA G2
NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Part of Royce at Cambridge Jump to booking NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Jump to booking Technical […]
Escalab 250Xi
Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Part of Royce at Cambridge Jump to booking Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Jump to booking Technical specifications Key Capabilities XPS for […]
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Welcome to the Collaborative R&D Environment for Physics There is a scheduled maintenance between 19:00 to 21:00 BST on 28 June 2024. During this time the website is unavailable. If you wish to contact us, please email corde@phy.cam.ac.uk. The booking system is still available for existing users. We apologise for any inconvenience caused. Part of […]