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Hitachi 5500 Brief description The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging. The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy […]
Hitachi SU 8600 Brief description The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating. Jump to booking […]
Helios 600 i Brief description The Helios 600 tool is used for imaging and chemical analysis (EDS) and crystallographic analysis (EBSD). It is also used for site specific sample preparation (both cross-section and TEM lamellae preparation), Slive and View, large area mapping and nanopatterning and engineering. Jump to booking A-SHeM Brief description The SHeM is […]
Electron & Ion Beam Microscopy Our Electron and Ion Microscopy facility enables users to undertake scanning electron microscopy imaging and chemical analysis and focused ion beam nanofabrication and engineering and sample preparation. Key features Low kV high resolution imaging TEM sample preparation FIB slice and view Large area mapping Nano patterning and nanoengineering Enquire Now […]
