B-SHeM
B-SHeM Brief description The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs. The facility operates two SHeMs and […]
Atom Scattering
Atom Scattering A world-unique innovation at the Cambridge Atom Scattering and Atom Microscopy Facility enables ultra-sensitive structural and dynamic analysis of 2D materials and surfaces using helium atom scattering methods. Key features: A wide range of measurements is possible, although the main focus is on helium spin-echo (HeSE) dynamics measurements and scanning helium microscopy (SHeM). […]