The SHeMs operate in two primary and some secondary configurations and changes between those configurations take a few days. Experiments will usually performed only in one configuration. For topographic imaging of delicate samples the `high resolution’ configuration is used. For spot profile diffraction or other measurements requiring angular resolution the ‘diffraction’ configuration is used. Where spot profile diffraction is performed it is usually necessary to clean the sample by heating to ~100C in situ. For topographic imagining no sample preparation is required.  Samples must be smaller than 2cm and not too heavy as piezoelectric motors are used to scan the sample. Usual operation of the apparatus involves a researcher coming in person for the length of the experiments to perform the experiments with the support of an instrument scientist, technicians and local users. For theorists or groups that cannot send researches to the facility we offer a “full service” package whereby an expert in the field can help design and run your experiments.