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Helios 600 i
A focused ion beam (FIB) scanning electron microscope equipped with EDS and EBSD.
Hitachi SU 8600
The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging.
Hitachi 5500
The Hitachi 5500 utilises an ultra-stable cold field emission source and an In-lens optic system for ultra-high resolution sub nanometre SE and low kV STEM imaging.
If you are new to CORDE we would recommend contacting us via the form below to ensure we can help you with a detailed response. Or you can contact the Imaging Facility Scientist directly at electron.microscopy@phy.cam.ac.uk.
