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The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging. The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy dispersive analysis for chemical composition analysis at the sub 20 nm scale.
The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs.
The facility operates two SHeMs and the instrument used will be matched to your experimental requirements.
Item | Specification |
|---|---|
Secondary image resolution | 0.6 at 15 kV 1 nm at 1 kV |
Landing energy | 1-20 kV |
Detectors | Upper Detector (UD) with EXB filter: SE/BSE signal mixing function, in -column middle detector Duo STEM |
Maximum sample size | 3 mm square, height 2 mm |
EDS system | Oxford 80 Xmax |
Could write Samples/Material systems.
Hard to soft material systems.
Sample need to be cut/prepared smaller than 8 mm2.
Could write Mode of Operation.
Available in both User and Service Mode.
Fully operational
Whether you are new to the National Facility or have visited us before, our Getting Access page contains more information about booking our services.
Please allow two weeks between booking and use.
For pricing details and more information about the services we can provide please contact us.
If you are new to CORDE we would recommend contacting us via the form below to ensure we can help you with a detailed response. Or you can contact the team directly at electron.microscopy@phy.cam.ac.uk.
We’re happy to help; please contact us using the form above. Or try our searchable equipment directory for an overview of everything CORDE has to offer.
