Menu
The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions.
The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions.
The system uses a SPECS XR 50 MF X-ray Source, μ-FOCUS 600 X-ray monochromator and differentially pumped PHOIBOS 150 1D-DLD NAP analyser. The system also has scannable focused extractor type ion source for depth profiling. The system will be run as an XPS facility together with existing standard UHV-based XPS/UPS system.
Key Capabilities
• Controllable atmosphere from sample loading to analysis (up to 100 mbar)
• Adaptable process gas dosing system
• Sputter depth profiling
• Built-in plasma for cleaning and catalysis
• Laser heating up to 1000 ˚C
Powder, solid and some liquid samples
Not applicable
Please contact us with any other questions.
The current available gas sources are: N2, H2, compressed air, NH3, and ethylene. If you require gas input other than these, please contact the Facility Scientist.
Whether you are new to the National Facility or have visited us before, our Getting Access page contains more information about booking our services.
Please contact the Facility Scientist to discuss availability.
For pricing details and more information about the services we can provide please contact us.
If you are new to CORDE we would recommend contacting us via the form below to ensure we can help you with a detailed response. Or you can contact the team directly at xps@phy.cam.ac.uk.
We’re happy to help; please contact us using the form above. Or try our searchable equipment directory for an overview of everything CORDE has to offer.
