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The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating.
The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs.
The facility operates two SHeMs and the instrument used will be matched to your experimental requirements.
Item | Specification |
|---|---|
Secondary image resolution | 0.6 at 15 kV 0.7 nm at 1 kV |
Landing energy | 0.01-20 kV |
Detectors | Upper Detector (UD) with EXB filter: SE/BSE signal mixing function, in -column middle detector. |
Maximum sample size | 150 mm square, height 40 mm |
Coming soon
Whether you are new to the National Facility or have visited us before, our Getting Access page contains more information about booking our services.
Please allow two weeks between booking and use.
For pricing details and more information about the services we can provide please contact us.
If you are new to CORDE we would recommend contacting us via the form below to ensure we can help you with a detailed response. Or you can contact the team directly at electron.microscopy@phy.cam.ac.uk.
We’re happy to help; please contact us using the form above. Or try our searchable equipment directory for an overview of everything CORDE has to offer.
