Hitachi 5500
Hitachi 5500 Brief description The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging. The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy […]
Hitachi SU 8600
Hitachi SU 8600 Brief description The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating. Jump to booking […]
Helios 600 i
Helios 600 i Brief description The Helios 600 tool is used for imaging and chemical analysis (EDS) and crystallographic analysis (EBSD). It is also used for site specific sample preparation (both cross-section and TEM lamellae preparation), Slive and View, large area mapping and nanopatterning and engineering. Jump to booking A-SHeM Brief description The SHeM is […]
SPECS NAP-XPS
SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions. Part of Royce at Cambridge Jump to booking SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant […]
NEXSA G2
NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Part of Royce at Cambridge Jump to booking NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Jump to booking Technical […]
Escalab 250Xi
Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Part of Royce at Cambridge Jump to booking Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Jump to booking Technical specifications Key Capabilities XPS for […]
Electron Ion Beam Microscopy
Electron & Ion Beam Microscopy Our Electron and Ion Microscopy facility enables users to undertake scanning electron microscopy imaging and chemical analysis and focused ion beam nanofabrication and engineering and sample preparation. Key features Low kV high resolution imaging TEM sample preparation FIB slice and view Large area mapping Nano patterning and nanoengineering Enquire Now […]
XPS
XPS Our x-ray photoelectron spectrometer (XPS) facility is ideal for material analysis under variable environmental conditions. Key features: CORDE offers three XPS instruments with a wide range of capabilities and fast throughput of standard XPS measurements We can tailor experiments for specific requirements and provide professional support with high quality data acquisition and analysis Can […]
Characterisation
Characterisation Characterisation The CORDE Characterisation Facilities provide state-of-the-art characterisation capabilities, with the breadth of tooling and flexibility to support cutting-edge research. The CORDE Characterisation Facility is pleased to be able to offer facilities in “Service” and “User” Mode: You can commission a piece of work to be performed by the team of instrument scientists, providing […]
B-SHeM
B-SHeM Brief description The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs. The facility operates two SHeMs and […]
