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XPS Our x-ray photoelectron spectrometer (XPS) facility is ideal for material analysis under variable environmental conditions. Key features: CORDE offers three XPS instruments with a wide range of capabilities and fast throughput of standard XPS measurements We can tailor experiments for specific requirements and provide professional support with high quality data acquisition and analysis Can […]
Characterisation Characterisation The CORDE Characterisation Facilities provide state-of-the-art characterisation capabilities, with the breadth of tooling and flexibility to support cutting-edge research. The CORDE Characterisation Facility is pleased to be able to offer facilities in “Service” and “User” Mode: You can commission a piece of work to be performed by the team of instrument scientists, providing […]
B-SHeM Brief description The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs. The facility operates two SHeMs and […]
A-SHeM Brief description The SHeM is an atom microscope that resembles a miniaturised atom scattering beamline. Most of the system is under high (inc. sample chamber) and ultra-high vacuum and involves scattering a microscale atom beam off a sample. Samples are mounted on standard, or modified, SEM sample stubs. The facility operates two SHeMs and […]
Miniscat Brief description Miniscat is a compact atom scattering beamline designed to be compartible with the He-3 SpinEcho to perform preliminary measurements as well as independent atom diffraction experiments. The experiment is performed under high and ultra-high vacuum and involves scattering a beam of He-4 atoms off the sample. A custom sample transfer (compatible with […]
SpinEcho Brief description The SpinEcho is an atom beam line that uses He-3 to perform atom scattering experiments. The experiment is performed under high and ultra-high vacuum and involves scattering a polarised beam of helium (He-3) atoms off the sample. A custom sample transfer (compatible with MiniScat) is used for mounting samples within the scattering […]
Atom Scattering A world-unique innovation at the Cambridge Atom Scattering and Atom Microscopy Facility enables ultra-sensitive structural and dynamic analysis of 2D materials and surfaces using helium atom scattering methods. Key features: A wide range of measurements is possible, although the main focus is on helium spin-echo (HeSE) dynamics measurements and scanning helium microscopy (SHeM). […]
