Our dedicated 3D Imaging Centre offers non-destructive X-ray microscopy (XRM) for high-resolution, multi-scale analysis. We provide deep insights into internal structures across a diverse range of sample sizes and materials, supporting both fundamental research and industrial applications.
We provide support in custom scanning parameters and workflows to suit your specific research goals. Our facility supports critical internal structural analysis for additive manufacturing, battery research, microelectronics, and geological core characterisation.
Synchrotron-Calibre Resolution: Our instruments utilize a unique two-stage magnification architecture, delivering beamline-quality resolution (down to 450 nm) within a lab-based environment.
Advanced AI-Powered Analysis: We provide access to Dragonfly software, featuring deep-learning segmentation and automated object analysis for precise quantification of porosity, fibers, and defects.
Resolution at a Distance (RaaD): Maintain sub-micron detail even when using bulky in situ environmental cells or imaging large, dense samples that would traditionally require destructive sectioning.
The flagship of our imaging suite, the Versa 730 is optimised for high-energy applications and maximum throughput. Its exclusive 40x-Prime (40x-P) objective delivers industry-leading resolution (down to 450 nm) across the full X-ray energy range, making it ideal for dense, complex materials that require high penetration without compromising on detail.
Developed specifically to use Gas Cluster Ion Beams (GCIB), the J Series III offers a vast range of experimental conditions; from high energy small Ar clusters, ideal for reducing preferential sputtering of hybrid materials, through to gain water clusters to lift intact proteins from biological samples.
Get in touch with us and start your conversation with our team or book your access to the facility on the PPMS user login page.
© 2026 University of Cambridge
