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3D Imaging Centre Revealing structure beneath the surface Our dedicated 3D Imaging Centre offers non-destructive X-ray microscopy (XRM) for high-resolution, multi-scale analysis. We provide deep insights into internal structures across a diverse range of sample sizes and materials, supporting both fundamental research and industrial applications. Main features We provide support in custom scanning parameters and […]
Registration Programme Speakers Venue WHEN Tue 16 Sept 2025 10:30 AM – 17:00 PM WHERE Ogden Centre East – Durham University South Road Durham DH1 3LE Register now ORGANISED BY CORDE Academy, Department of Physics – University of Cambridge IN PARTNERSHIP WITH The Institute of Physics Durham University The Durham Institute of Research, Development, and […]
Hitachi 5500 Brief description The Hitachi 5500 utilises an ultra-stable cold field emission source and an in-field lens system for high resolution sub nanometre SE and low kV STEM imaging. The bright field (BF) and dark field (DF) Duo STEM detector allows simultaneous observations of BF and DF STEM images. The system also has energy […]
Hitachi SU 8600 Brief description The SU8600 utilises an ultra-stable cold field emission source to enable low-energy imaging for fine structure analysis as well as high-resolution imaging. The SE resolution is 0.7 nm at 1 kV landing energy provides high resolution imaging of beam sensitive materials without the need of gold coating. Jump to booking […]
Helios 600 i Brief description The Helios 600 tool is used for imaging and chemical analysis (EDS) and crystallographic analysis (EBSD). It is also used for site specific sample preparation (both cross-section and TEM lamellae preparation), Slive and View, large area mapping and nanopatterning and engineering. Jump to booking A-SHeM Brief description The SHeM is […]
SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant environmental conditions. Part of Royce at Cambridge Jump to booking SPECS NAP-XPS Brief description The near ambient pressure (NAP) X-ray photoemission spectroscopy (XPS) system is for high-throughput chemical surface analysis under application relevant […]
NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Part of Royce at Cambridge Jump to booking NEXSA G2 Brief description The Thermo Scientific Nexsa G2 Surface Analysis System is a high-performance X-ray photoelectron spectrometer with fast sample loading. Jump to booking Technical […]
Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Part of Royce at Cambridge Jump to booking Escalab 250Xi Brief description The Thermo Scientific Escalab 250Xi XPS Microscope is a multi-technique instrument with flexibility and configurability. Jump to booking Technical specifications Key Capabilities XPS for […]
Electron & Ion Beam Microscopy Our Electron and Ion Microscopy facility enables users to undertake scanning electron microscopy imaging and chemical analysis and focused ion beam nanofabrication and engineering and sample preparation. Key features Low kV high resolution imaging TEM sample preparation FIB slice and view Large area mapping Nano patterning and nanoengineering Enquire Now […]
